Hyperlux™ ID iToF series extends depth measurement distance up to 30 meters, improving productivity and safety in industrial environments.
ON Semiconductor launched its first real-time, indirect time-of-flight (iToF) sensor Hyperlux™ ID series, which uses ON Semiconductor's new proprietary global shutter pixel architecture and comes with its own memory to capture the entire scene while performing depth measurement in real time. It can perform high-precision long-distance measurement and three-dimensional imaging of fast-moving objects. This innovative approach breaks through the limitations of standard iToF sensors and achieves depth perception up to 30 meters, which is four times that of standard iToF sensors, and in a smaller form factor.
With the widespread application of automation and robotics in the industrial field, the Hyperlux ID series realizes ultra-depth perception capabilities, can work in dynamic scene conditions and capture fast-moving objects.
The Hyperlux ID Series is suitable for a wide range of industrial environments:
-Manufacturing & Quality Control: Ensure products meet quality standards by measuring the volume and shape of objects and detecting defects.
-Automation & Robotics: Improve safety on the factory floor by detecting objects for better navigation and obstacle avoidance.
-Access Control Systems: Provide high-precision, high-accuracy facial recognition for payment terminals, home and commercial entrance systems, etc.
-Agriculture & Planting: Monitor crop growth and health by measuring plant height, detecting diseases, and optimizing irrigation and fertilization processes.
-Logistics & Material Handling: Optimize warehouse management and transportation processes by measuring the position, size and proportion of pallets and goods.
“Thanks to the close collaboration with ON Semiconductor, we were able to very quickly develop and expand our 3D camera family to include a cost-effective time-of-flight camera for large-scale indoor and outdoor applications,” said Alexander Lewinsky, Managing Director of IDS Imaging Development Systems.